IEEE Reliability Society Newsletter     Vol. 56, No. 1. February 2010
Table of Content

Front page:
 President's Message
From the Editor

Society News:
Meet the RS officers and
AdCom Class of 2012

RS Members Receive Fellows Recognition

Awards:
Reliability Engineers Recognized at the Annual RS Banquet.

Distinguished Lecturer Program:
Call for RS
Distinguished Lecturers

Feature Article:
 NXT Battery Voltage Experiment

Chapter Activities:
Cleveland Chapter
Dallas Chapter
Singapore Chapter


Technical Activities:
Annual Technology Report

Announcements:
New Smart Grid Technology Initiative

Security and Privacy Magazine: Call for Papers

Links:
Reliability Society Home
RS Newsletter Homepage

RS Members Receive IEEE Fellows Recognition

Three members of the IEEE Reliability Society were recently elevated to the prestigious member grade of fellow, the highest grade recognition offered by the IEEE. According IEEE procedures "The IEEE Grade of Fellow is conferred by the Board of Directors upon a person with an extraordinary record of accomplishments in any of the IEEE fields of interest. A brief citation is issued to new Fellows describing their accomplishments and the total number selected in any one year does not exceed one-tenth of one percent of the total voting Institute membership. Each elevated member also receives a congratulatory letter from the president and a gold Fellow pin."

Congratulations are extended to the following new fellows:

Dimitros Ioannou
Larry Matthies
Jeffrey Voas

For more information about the IEEE Fellow Grade and procedures for nomination and award, visit the following link: http://www.ieee.org/web/membership/fellows/index.html